
Holding unseen connector assemblies as anomalies
An unlabelled connector assembly arrangement can appear. Instead of forcing the new type into a known defect label, show its local difference from the normal layout.
Link the departure-from-normal score and pin region to the sample identity without automatically naming the assembly issue. Hold the specimen in the review nest.

- 01 Normal reference
- 02 New image
- 03 Local comparison
- 04 Score threshold
- 05 Send for review
Select the illustrative reference gallery of normal examples only.
- Local anomaly score
- —
- Above-threshold area
- —
- Illustrative score threshold
- —
Scenes are illustrative simulations; they are not customer references or performance guarantees.
Solution approach
Local features of normal examples are compared with the new ROI. Raw evidence, normal reference and a continuous anomaly map appear separately; the score threshold is not a defect class. Register the nominal pin layout and compare new ROI features with the normal gallery. Localise the unusual pin island on the heatmap.
Process steps
- 01
Normal reference
Select the illustrative reference gallery of normal examples only.
- 02
New image
Image the new sample under the same lighting and registration conditions.
- 03
Local comparison
Show local feature deviation as a continuous heatmap.
- 04
Score threshold
Show the local score and above-threshold area as separate criteria.
- 05
Send for review
Hold an anomalous example for the operator without inventing a defect type.
Related applications
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