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E3TAM

Holding unseen connector assemblies as anomalies

Solution concept

An unlabelled connector assembly arrangement can appear. Instead of forcing the new type into a known defect label, show its local difference from the normal layout.

Artificial intelligenceresearch-backed conceptraw image / analysis separationnormal-only local score
Information delivered

Link the departure-from-normal score and pin region to the sample identity without automatically naming the assembly issue. Hold the specimen in the review nest.

Holding unseen connector assemblies as anomaliesILLUSTRATIVE SIMULATION
Holding unseen connector assemblies as anomalies
  1. 01 Normal reference
  2. 02 New image
  3. 03 Local comparison
  4. 04 Score threshold
  5. 05 Send for review
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Select the illustrative reference gallery of normal examples only.

Local anomaly score
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Above-threshold area
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Illustrative score threshold
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Scenes are illustrative simulations; they are not customer references or performance guarantees.

Solution approach

Local features of normal examples are compared with the new ROI. Raw evidence, normal reference and a continuous anomaly map appear separately; the score threshold is not a defect class. Register the nominal pin layout and compare new ROI features with the normal gallery. Localise the unusual pin island on the heatmap.

Process steps

  1. 01

    Normal reference

    Select the illustrative reference gallery of normal examples only.

  2. 02

    New image

    Image the new sample under the same lighting and registration conditions.

  3. 03

    Local comparison

    Show local feature deviation as a continuous heatmap.

  4. 04

    Score threshold

    Show the local score and above-threshold area as separate criteria.

  5. 05

    Send for review

    Hold an anomalous example for the operator without inventing a defect type.

Vision system design

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